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Memory & Motherboard Test Procedures & Reports
The memory module testing process involves various combinations of the following types of tests being performed:

Paper Screening (performed by the manufacturer) (applies only to memory modules)
A paper screen is a review of critical timings, electrical characteristics, timing requirements, environmental requirements, and packaging requirements in order to see if the motherboard & DIMM meets industry specifications.

Physical dimensions
Each memory module that is submitted for testing is meticulously checked and measured to ensure compliance with proper PCB manufacturing standards and practices.

SPD Testing (applies only to memory modules)
The SPD contents test ensures the memory module’s SPD EEPROM is programmed properly and is in compliance with all the current industry standards. The modules and motherboards must be fully compatible with and will be checked to ensure proper identification and functionality in the motherboard is made.

Power cycling Test
Power cycle testing involves powering on and off the motherboard platform for 50~100 cycles. This test checks the memory module and motherboard’s ability to be cycled and makes sure the system will boot properly an indefinite number of times without errors. This test verifies system response to different DIMM sizes, module organization and amount of memory installed on the board.

S3 (suspend to RAM) test
The S3 test is performed to ensure that the memory modules being tested correctly refreshed by the motherboard and are capable of retaining their contents through an S3 power management state. The motherboard and memory modules S3 interoperability is tested to see that no test data is lost or corrupted during the testing.

Room temperature & nominal voltage functional testing
The room temperature testing involves testing the memory modules and the motherboard while running CMTL’s MCFT card (Memory Compatibility and Functionality Tester) and additional memory stress software under room temperature conditions. Each memory module and motherboard test cycle typically last 24 (server platforms only for room temperature testing).

Elevated temperature and voltage margining functional testing
The elevated temperature testing and voltage margining tests involve testing the memory modules and the motherboard for which it is being tested while fluctuating power voltages (+/-5~9% depending on the motherboard) to the memory modules under test for extended periods of time during elevated temperatures (50c to 55c). The test involves testing the memory modules on the motherboard while running CMTL’s MCFT card (Memory Compatibility and Functionality Tester) and additional memory stress software under these harsh conditions. Each memory module and motherboard test cycle typically last from 24 for desktops and 24~48 hours for server platforms.

Memory modules & motherboards that have completed all the testing phases under the CMTL Advanced Testing or the CMTL Memory & Motherboard Certification process will be known to be compatible with the specific memory & motherboard on which they were tested, and will be listed as “Passed” or “Certified” (certification can only be achieved if the product has passed all the certification requirements from CMTL) on the CMTL website and should also be listed on the memory & motherboard manufacturers tested memory websites and documentation.

Sample Reports & Test Procedures for Download
(Some procedures may require manufacturer registration prior to downloading from CMTL)

CMTL Memory Testing Final Report
Test Procedure (secure logon required)
Intel Server
Intel Desktop
Clone (Non-Intel)
Failure Report (All)